Investigation on the Worst Read Scenario of a ReRAM Crossbar Array

Yelim Youn, Kwangmin Kim, Jae-Yoon Sim, Hong June Park, Byungsub Kim. Investigation on the Worst Read Scenario of a ReRAM Crossbar Array. IEEE Trans. VLSI Syst., 25(9):2402-2410, 2017. [doi]

Abstract

Abstract is missing.