Automatic stress effects computation based on a layout generation tool for analog IC

Stephanie Youssef, Damien Dupuis, Ramy Iskander, Marie-Minerve Louërat. Automatic stress effects computation based on a layout generation tool for analog IC. In Laurence Nagel, Jesse Chen, Ronald S. Vogelsong, editors, 2010 IEEE International Behavioral Modeling and Simulation Conference, BMAS 2010, San Jose, CA, USA, September 23-24, 2010. pages 7-12, IEEE, 2010. [doi]

Abstract

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