Li Yu, Wen-Yao Chang, Kewei Zuo, Jean Wang, Douglas Yu, Duane S. Boning. Methodology for analysis of TSV stress induced transistor variation and circuit performance. In Keith A. Bowman, Kamesh V. Gadepally, Pallab Chatterjee, Mark M. Budnik, Lalitha Immaneni, editors, Thirteenth International Symposium on Quality Electronic Design, ISQED 2012, Santa Clara, CA, USA, March 19-21, 2012. pages 216-222, IEEE, 2012. [doi]
Abstract is missing.