Xiaoming Yu, Alessandro Fin, Franco Fummi, Elizabeth M. Rudnick. Functional Test Generation For Digital Integrated Circuits Using A Genetic Algorithm. In William B. Langdon, Erick Cantú-Paz, Keith E. Mathias, Rajkumar Roy, David Davis, Riccardo Poli, Karthik Balakrishnan, Vasant Honavar, Günter Rudolph, Joachim Wegener, Larry Bull, Mitchell A. Potter, Alan C. Schultz, Julian F. Miller, Edmund K. Burke, Natasa Jonoska, editors, GECCO 2002: Proceedings of the Genetic and Evolutionary Computation Conference, New York, USA, 9-13 July 2002. pages 1275, Morgan Kaufmann, 2002.
Abstract is missing.