Hak-soo Yu, Sungbae Hwang, Jacob A. Abraham. DSP-Based Statistical Self Test of On-Chip Converters. In 21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, CA, USA. pages 83-88, IEEE Computer Society, 2003. [doi]
Abstract is missing.