Bo Yu, Xin Li, James Yonemura, Zhiyuan Wu, Jung-Suk Goo, Ciby Thuruthiyil, Ali Icel. Modeling local variation of low-frequency noise in MOSFETs via sum of lognormal random variables. In Proceedings of the IEEE 2012 Custom Integrated Circuits Conference, CICC 2012, San Jose, CA, USA, September 9-12, 2012. pages 1-4, IEEE, 2012. [doi]
Abstract is missing.