Statistical modeling with the virtual source MOSFET model

Li Yu, Lan Wei, Dimitri A. Antoniadis, Ibrahim M. Elfadel, Duane S. Boning. Statistical modeling with the virtual source MOSFET model. In Enrico Macii, editor, Design, Automation and Test in Europe, DATE 13, Grenoble, France, March 18-22, 2013. pages 1454-1457, EDA Consortium San Jose, CA, USA / ACM DL, 2013. [doi]

Abstract

Abstract is missing.