EBL Overlapping Aware Stencil Planning for MCC System

Bei Yu, Kun Yuan, Jhih-Rong Gao, Shiyan Hu, David Z. Pan. EBL Overlapping Aware Stencil Planning for MCC System. ACM Trans. Design Autom. Electr. Syst., 21(3):43, 2016. [doi]

Abstract

Abstract is missing.