A new reliability evaluation method for embedded system

Jie Yu, Xuehai Zhou. A new reliability evaluation method for embedded system. In Qiang Wu, Xiangjian He, Quang Vinh Nguyen, Wenjing Jia, Mao Lin Huang, editors, Proceedings of 8th IEEE International Conference on Computer and Information Technology, CIT 2008, Sydney, Australia, July 8-11, 2008. pages 224-230, IEEE, 2008. [doi]

Abstract

Abstract is missing.