J. S. Yuan, S. Chen. Power amplifier resilient design for process and temperature variations using an on-chip PLL sensing signal. Microelectronics Reliability, 54(1):167-171, 2014. [doi]
@article{YuanC14-0,
title = {Power amplifier resilient design for process and temperature variations using an on-chip PLL sensing signal},
author = {J. S. Yuan and S. Chen},
year = {2014},
doi = {10.1016/j.microrel.2013.09.006},
url = {http://dx.doi.org/10.1016/j.microrel.2013.09.006},
researchr = {https://researchr.org/publication/YuanC14-0},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {54},
number = {1},
pages = {167-171},
}