A Power Efficient Test Data Compression Method for SoC using Alternating Statistical Run-Length Coding

Haiying Yuan, Kun Guo, Xun Sun, Zijian Ju. A Power Efficient Test Data Compression Method for SoC using Alternating Statistical Run-Length Coding. J. Electronic Testing, 32(1):59-68, 2016. [doi]

Abstract

Abstract is missing.