Device-Aware Test for Back-Hopping Defects in STT-MRAMs

Sicong Yuan, Mottaqiallah Taouil, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, Said Hamdioui. Device-Aware Test for Back-Hopping Defects in STT-MRAMs. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2023, Antwerp, Belgium, April 17-19, 2023. pages 1-6, IEEE, 2023. [doi]

Authors

Sicong Yuan

This author has not been identified. Look up 'Sicong Yuan' in Google

Mottaqiallah Taouil

This author has not been identified. Look up 'Mottaqiallah Taouil' in Google

Moritz Fieback

This author has not been identified. Look up 'Moritz Fieback' in Google

Hanzhi Xun

This author has not been identified. Look up 'Hanzhi Xun' in Google

Erik Jan Marinissen

This author has not been identified. Look up 'Erik Jan Marinissen' in Google

Gouri Sankar Kar

This author has not been identified. Look up 'Gouri Sankar Kar' in Google

Sidharth Rao

This author has not been identified. Look up 'Sidharth Rao' in Google

Sebastien Couet

This author has not been identified. Look up 'Sebastien Couet' in Google

Said Hamdioui

This author has not been identified. Look up 'Said Hamdioui' in Google