Device-Aware Test for Back-Hopping Defects in STT-MRAMs

Sicong Yuan, Mottaqiallah Taouil, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, Said Hamdioui. Device-Aware Test for Back-Hopping Defects in STT-MRAMs. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2023, Antwerp, Belgium, April 17-19, 2023. pages 1-6, IEEE, 2023. [doi]

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