Device-Aware Test for Back-Hopping Defects in STT-MRAMs

Sicong Yuan, Mottaqiallah Taouil, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, Said Hamdioui. Device-Aware Test for Back-Hopping Defects in STT-MRAMs. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2023, Antwerp, Belgium, April 17-19, 2023. pages 1-6, IEEE, 2023. [doi]

@inproceedings{YuanTFXMKRCH23,
  title = {Device-Aware Test for Back-Hopping Defects in STT-MRAMs},
  author = {Sicong Yuan and Mottaqiallah Taouil and Moritz Fieback and Hanzhi Xun and Erik Jan Marinissen and Gouri Sankar Kar and Sidharth Rao and Sebastien Couet and Said Hamdioui},
  year = {2023},
  doi = {10.23919/DATE56975.2023.10137071},
  url = {https://doi.org/10.23919/DATE56975.2023.10137071},
  researchr = {https://researchr.org/publication/YuanTFXMKRCH23},
  cites = {0},
  citedby = {0},
  pages = {1-6},
  booktitle = {Design, Automation & Test in Europe Conference & Exhibition, DATE 2023, Antwerp, Belgium, April 17-19, 2023},
  publisher = {IEEE},
  isbn = {978-3-9819263-7-8},
}