Sicong Yuan, Z. Zhang, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, M. Taouil, Said Hamdioui. Magnetic Coupling Based Test Development for Contact and Interconnect Defects in STT-MRAMs. In IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023. pages 236-245, IEEE, 2023. [doi]
Abstract is missing.