Automatic mura inspection using the principal component analysis for the TFT-LCD panel

Jim-Woo Yun, Heon Gu, Dae-Hwan Kim, Hoi-Sik Moon, Sung Jea Ko. Automatic mura inspection using the principal component analysis for the TFT-LCD panel. In IEEE International Conference on Consumer Electronics - Taiwan, ICCE-TW 2014, Taipei, Taiwan, May 26-28, 2014. pages 109-110, IEEE, 2014. [doi]

Abstract

Abstract is missing.