HanCheon Yun, Hyein Shin, Myeonggu Kang, Lee-Sup Kim. Optimizing ADC Utilization through Value-Aware Bypass in ReRAM-based DNN Accelerator. In 58th ACM/IEEE Design Automation Conference, DAC 2021, San Francisco, CA, USA, December 5-9, 2021. pages 1087-1092, IEEE, 2021. [doi]
Abstract is missing.