Assessment of dielectric charging in electrostatically driven MEMS devices: A comparison of available characterization techniques

U. Zaghloul, M. Koutsoureli, H. Wang, Fabio Coccetti, G. Papaioannou, Patrick Pons, Robert Plana. Assessment of dielectric charging in electrostatically driven MEMS devices: A comparison of available characterization techniques. Microelectronics Reliability, 50(9-11):1615-1620, 2010. [doi]

Abstract

Abstract is missing.