Saif al Zahir, Aiman El-Maleh, Esam Khan. An efficient test vector compression technique based on geometric shapes [system-on-a-chip]. In Proceedings of the 2001 8th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2001, Malta, September 2-5, 2001. pages 1561-1564, IEEE, 2001. [doi]
Abstract is missing.