Sebastian Zambal, Christian Eitzinger, Michael Clarke, John Klintworth, Pierre-Yves Mechin. A digital twin for composite parts manufacturing : Effects of defects analysis based on manufacturing data. In 16th IEEE International Conference on Industrial Informatics, INDIN 2018, Porto, Portugal, July 18-20, 2018. pages 803-808, IEEE, 2018. [doi]
Abstract is missing.