Qiyan Zang, Jian Zhang 0002, Liling Bo, Yuchen Xiao, Guangwei Gao, Heng Zhang 0001, Hongran Li, Zhaoman Zhong, Yan Ren. A fully automatic adjacent key-points localization framework for minimal repeated pattern detection in printed fabric images. Knowl.-Based Syst., 300:112157, 2024. [doi]
Abstract is missing.