Reliability Physics of GaN HEMT Microwave Devices: The Age of Scaling

Enrico Zanoni, Matteo Meneghini, Gaudenzio Meneghesso, Fabiana Rampazzo, Daniele Marcon, Veronica Gao Zhan, Francesca Chiocchetta, Andreas Graff, Frank Altmann, Michél Simon-Najasek, David Poppitz. Reliability Physics of GaN HEMT Microwave Devices: The Age of Scaling. In 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020. pages 1-10, IEEE, 2020. [doi]

Authors

Enrico Zanoni

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Matteo Meneghini

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Gaudenzio Meneghesso

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Fabiana Rampazzo

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Daniele Marcon

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Veronica Gao Zhan

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Francesca Chiocchetta

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Andreas Graff

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Frank Altmann

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Michél Simon-Najasek

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David Poppitz

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