A 3D multi-frequency response electrical mesh phantom for validation of the planar structure EIT system performance

A. Zarafshani, T. Qureshi, T. Bach, Chris R. Chatwin, M. Soleimani. A 3D multi-frequency response electrical mesh phantom for validation of the planar structure EIT system performance. In 2016 IEEE International Conference on Electro Information Technology, EIT 2016, Grand Forks, ND, USA, May 19-21, 2016. pages 600-604, IEEE, 2016. [doi]

Authors

A. Zarafshani

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T. Qureshi

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T. Bach

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Chris R. Chatwin

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M. Soleimani

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