Low-Cost IP Core Test Using Multiple-Mode Loading Scan Chain and Scan Chain Clusters - researchr publication

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Gang Zeng, Youhua Shi, Toshinori Takabatake, Masao Yanagisawa, Hideo Ito. Low-Cost IP Core Test Using Multiple-Mode Loading Scan Chain and Scan Chain Clusters. In 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA. pages 136-144, IEEE Computer Society, 2006. [doi]

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