Zhengran Zeng, Yuqun Zhang, Haotian Zhang, Lingming Zhang. Deep just-in-time defect prediction: how far are we?. In Cristian Cadar, Xiangyu Zhang 0001, editors, ISSTA '21: 30th ACM SIGSOFT International Symposium on Software Testing and Analysis, Virtual Event, Denmark, July 11-17, 2021. pages 427-438, ACM, 2021. [doi]
Abstract is missing.