Wei Zeng, Hengliang Zhu, Xuan Zeng, Dian Zhou, Rueywen Liu, Xin Li. C-YES: An Efficient Parametric Yield Estimation Approach for Analog and Mixed-Signal Circuits Based on Multicorner-Multiperformance Correlations. IEEE Trans. on CAD of Integrated Circuits and Systems, 36(6):899-912, 2017. [doi]
Abstract is missing.