Detecting LED Chip Surface Defects with Modified Faster R-CNN

Zhiwen Zhang, Qian Gong, Yuan Cao, Cheng Yin, Enyi Yao, Yanhua Liu, Yongqing Pan. Detecting LED Chip Surface Defects with Modified Faster R-CNN. In 18th International SoC Design Conference, ISOCC 2021, Jeju Island, South Korea, Republic of, October 6-9, 2021. pages 268-269, IEEE, 2021. [doi]

Abstract

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