Fanchen Zhang, Daphne Hwong, Yi Sun, Allison Garcia, Soha Alhelaly, Geoff Shofner, LeRoy Winemberg, Jennifer Dworak. Putting wasted clock cycles to use: Enhancing fortuitous cell-aware fault detection with scan shift capture. In 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016. pages 1-10, IEEE, 2016. [doi]
Abstract is missing.