RTS Noise and Dark Current White Defects Reduction Using Selective Averaging Based on a Multi-Aperture System

Bo Zhang, Keiichiro Kagawa, Taishi Takasawa, Min-Woong Seo, Keita Yasutomi, Shoji Kawahito. RTS Noise and Dark Current White Defects Reduction Using Selective Averaging Based on a Multi-Aperture System. Sensors, 14(1):1528-1543, 2014. [doi]

Abstract

Abstract is missing.