Built-In Self-Diagnosis and Fault-Tolerant Daisy-Chain Design in MEDA Biochips

Ling Zhang, Zipeng Li, Krishnendu Chakrabarty. Built-In Self-Diagnosis and Fault-Tolerant Daisy-Chain Design in MEDA Biochips. In IEEE International Test Conference, ITC 2018, Phoenix, AZ, USA, October 29 - Nov. 1, 2018. pages 1-10, IEEE, 2018. [doi]

Abstract

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