Xu Zhang, Fanyu Liu, Bo Li 0051, Siyuan Chen, Yang Huang, Jiangjiang Li, Jian Jiao, Tianchun Ye, Jiajun Luo. The Synergetic Effects of Total Ionizing Dose and High Temperature on 180 nm DSOI Technology. In IEEE Asia Pacific Conference on Circuit and Systems, APCCAS 2022, Shenzhen, China, November 11-13, 2022. pages 532-535, IEEE, 2022. [doi]
Abstract is missing.