Wangyang Zhang, Xin Li, Sharad Saxena, Andrzej J. Strojwas, Rob A. Rutenbar. Automatic clustering of wafer spatial signatures. In The 50th Annual Design Automation Conference 2013, DAC '13, Austin, TX, USA, May 29 - June 07, 2013. pages 71, ACM, 2013. [doi]
Abstract is missing.