Qinghao Zhang, Geye Lu, Pinjia Zhang. A Novel Converter-level Si Material Degradation Monitoring Method Based on the DC Bus Leakage Current. In IECON 2021 - 47th Annual Conference of the IEEE Industrial Electronics Society, Toronto, ON, Canada, October 13-16, 2021. pages 1-6, IEEE, 2021. [doi]
Abstract is missing.