Improving Small-Delay Fault Coverage of On-Chip Delay Measurement by Segmented Scan and Test Point Insertion

Wenpo Zhang, Kazuteru Namba, Hideo Ito. Improving Small-Delay Fault Coverage of On-Chip Delay Measurement by Segmented Scan and Test Point Insertion. IEICE Transactions, 97-D(10):2719-2729, 2014. [doi]

Abstract

Abstract is missing.