Guopeng Zhang, Massimo Piccardi. Sequential Labeling with Structural SVM Under an Average Precision Loss. In Antonio Robles-Kelly, Marco Loog, Battista Biggio, Francisco Escolano, Richard Wilson, editors, Structural, Syntactic, and Statistical Pattern Recognition - Joint IAPR International Workshop, S+SSPR 2016, Mérida, Mexico, November 29 - December 2, 2016, Proceedings. Volume 10029 of Lecture Notes in Computer Science, pages 344-354, 2016. [doi]
Abstract is missing.