A Bulk Built-In Voltage Sensor to Detect Physical Location of Single-Event Transients

Zhichao Zhang, Yi Ren, Li Chen, Nelson J. Gaspard, Arthur F. Witulski, W. Timothy Holman, Bharat L. Bhuva, Shi-Jie Wen, Ramaswami Sammynaiken. A Bulk Built-In Voltage Sensor to Detect Physical Location of Single-Event Transients. J. Electronic Testing, 29(2):249-253, 2013. [doi]

Abstract

Abstract is missing.