A Bulk Built-In Voltage Sensor to Detect Physical Location of Single-Event Transients - researchr publication related

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Zhichao Zhang, Yi Ren, Li Chen, Nelson J. Gaspard, Arthur F. Witulski, W. Timothy Holman, Bharat L. Bhuva, Shi-Jie Wen, Ramaswami Sammynaiken. A Bulk Built-In Voltage Sensor to Detect Physical Location of Single-Event Transients. J. Electronic Testing, 29(2):249-253, 2013. [doi]

The following publications are possibly variants of this publication:

A new Bulk Built-In Current Sensing circuit for single-event transient detectionZhichao Zhang, Tao Wang, Li Chen, Jinsheng Yang. ccece 2010: 1-4 [doi]

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