Design of Robust Latch for Multiple-Node Upset (MNU) Mitigation in Nanoscale CMOS Technology

Nan Zhang, Xiaohui Su, Jing Guo 0004. Design of Robust Latch for Multiple-Node Upset (MNU) Mitigation in Nanoscale CMOS Technology. IEEE Access, 8:126582-126590, 2020. [doi]

Abstract

Abstract is missing.