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ConMem: detecting severe concurrency bugs through an effect-oriented approach

Wei Zhang, Chong Sun, Shan Lu. ConMem: detecting severe concurrency bugs through an effect-oriented approach. In James C. Hoe, Vikram S. Adve, editors, Proceedings of the 15th International Conference on Architectural Support for Programming Languages and Operating Systems, ASPLOS 2010, Pittsburgh, Pennsylvania, USA, March 13-17, 2010. pages 179-192, ACM, 2010. [doi]

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