Juntan Zhang, Feng-Wen Sun, Jie Song, Adam Von Ancken, Richard Zhai. Fine-Grained Image Classification via Spatial Saliency Extraction. In M. Arif Wani, Mehmed Kantardzic, Moamar Sayed Mouchaweh, João Gama, Edwin Lughofer, editors, 17th IEEE International Conference on Machine Learning and Applications, ICMLA 2018, Orlando, FL, USA, December 17-20, 2018. pages 249-255, IEEE, 2018. [doi]
Abstract is missing.