An Qi Zhang, Amr M. S. Tosson, Lan Wei. Error Resilience and Recovery of Process Induced Stuck-at Faults in MLP Neural Networks using Emerging Technology. In IEEE/ACM International Symposium on Nanoscale Architectures, NANOARCH 2021, AB, Canada, November 8-10, 2021. pages 1-6, IEEE, 2021. [doi]
Abstract is missing.