STAT: Mean and Variance Characterization for Robust Inference of DNNs on Memristor-based Platforms

Baogang Zhang, Necati Uysal, Rickard Ewetz. STAT: Mean and Variance Characterization for Robust Inference of DNNs on Memristor-based Platforms. In Houman Homayoun, Baris Taskin, Tinoosh Mohsenin, Weisheng Zhao, editors, Proceedings of the 2019 on Great Lakes Symposium on VLSI, GLSVLSI 2019, Tysons Corner, VA, USA, May 9-11, 2019. pages 339-342, ACM, 2019. [doi]

Abstract

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