High energy white beam x-ray diffraction studies of residual strains in engineering components

Shu Yan Zhang, Willem J. J. Vorster, Tea-Sung Jun, Xu Song, Mina Golshan, David Laundy, Michael J. Walsh, Alexander M. Korsunsky. High energy white beam x-ray diffraction studies of residual strains in engineering components. In Sio Iong Ao, Leonid Gelman, David W. L. Hukins, Andrew Hunter, A. M. Korsunsky, editors, Proceedings of the World Congress on Engineering, WCE 2007, London, UK, 2-4 July, 2007. Lecture Notes in Engineering and Computer Science, pages 1187-1192, Newswood Limited, 2007.

Abstract

Abstract is missing.