Path-delay fingerprinting for identification of recovered ICs

Xuehui Zhang, Kan Xiao, Mohammad Tehranipoor. Path-delay fingerprinting for identification of recovered ICs. In 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012. pages 13-18, IEEE Computer Society, 2012. [doi]

Abstract

Abstract is missing.