Rui Zhang, Kexin Yang, Taizhi Liu, Linda Milor. Estimation of the Optimal Accelerated Test Region for FinFET SRAMs Degraded by Front-End and Back-End Wearout Mechanisms. In Conference on Design of Circuits and Integrated Systems, DCIS 2018, Lyon, France, November 14-16, 2018. pages 1-6, IEEE, 2018. [doi]
Abstract is missing.