Current based PUF exploiting random variations in SRAM cells

Fengchao Zhang, Shuo Yang, Jim Plusquellic, Swarup Bhunia. Current based PUF exploiting random variations in SRAM cells. In Luca Fanucci, Jürgen Teich, editors, 2016 Design, Automation & Test in Europe Conference & Exhibition, DATE 2016, Dresden, Germany, March 14-18, 2016. pages 277-280, IEEE, 2016. [doi]

Abstract

Abstract is missing.