A theoretical analysis on cloning the failed test cases to improve spectrum-based fault localization

Long Zhang, Lanfei Yan, Zhenyu Zhang, Jian Zhang, W. K. Chan, Zheng Zheng. A theoretical analysis on cloning the failed test cases to improve spectrum-based fault localization. Journal of Systems and Software, 129:35-57, 2017. [doi]

Abstract

Abstract is missing.