Performance-effective compaction of standard cell library for edge-triggered latches utilizing 0.5 micron technology

Chun Zhao, W. Pan, C. Z. Zhao, Ka Lok Man, J. Choi, J. Chang. Performance-effective compaction of standard cell library for edge-triggered latches utilizing 0.5 micron technology. In International SoC Design Conference, ISOCC 2011, Jeju, South Korea, November 17-18, 2011. pages 313-316, IEEE, 2011. [doi]

Abstract

Abstract is missing.