CACI: Dynamic Current Analysis Towards Robust Recycled Chip Identification

Yu Zheng, Abhishek Basak, Swarup Bhunia. CACI: Dynamic Current Analysis Towards Robust Recycled Chip Identification. In The 51st Annual Design Automation Conference 2014, DAC '14, San Francisco, CA, USA, June 1-5, 2014. pages 1-6, ACM, 2014. [doi]

Abstract

Abstract is missing.