Wujie Zheng, Qirun Zhang, Michael R. Lyu, Tao Xie. Random unit-test generation with MUT-aware sequence recommendation. In Charles Pecheur, Jamie Andrews, Elisabetta Di Nitto, editors, ASE 2010, 25th IEEE/ACM International Conference on Automated Software Engineering, Antwerp, Belgium, September 20-24, 2010. pages 293-296, ACM, 2010. [doi]
Abstract is missing.